Click here to purchase This standard specifies the characteristics of the UFS electrical interface and the memory device. Such characteristics include (among others) low power consumption, high data throughput, low electromagnetic interference and optimization for mass memory subsystem efficiency. The UFS electrical interface is based on an advanced differential interface by MIPI M-PHY standard...
Click here to purchase The purpose of this standard is definition of an UFS Universal Flash Storage electrical interface and an UFS memory device. This standard defines a unique UFS feature set and includes the feature set of e-MMC Specification as a subset. This standard references also several other standard specifications by MIPI (M-PHY and UniPro Specifications) and INCITS T10 (SBC, SPC and...
Click here to purchase This standard specifies the characteristics of the UFS electrical interface and the memory device. Such 5 characteristics include (among others) low power consumption, high data throughput, low 6 electromagnetic interference and optimization for mass memory subsystem efficiency. The UFS electrical 7 interface is based on an advanced differential interface by MIPI M-PHY...
Click here to purchase The purpose of this standard is definition of an UFS Universal Flash Storage electrical interface and an UFS memory device. This standard defines a unique UFS feature set and includes the feature set of eMMC Specification as a subset. This standard references also several other standard specifications by MIPI (M-PHY and UniPro Specifications) and INCITS T10 (SBC, SPC and...
Click here to purchase The primary objective of this test standard is to specify the test cases for UFS device protocol conformance testing. This test standard provides test cases for checking the functions defined in the following target standard: JESD220, Universal Flash Storage (UFS) Standard version 1.1A. MIPI M-PHY and MIPI UniPro test cases are not in the scope of this document. Product...
Click here to purchase The primary objective of this test standard is to specify the test cases for UFS device protocolconformance testing. This test standard provides test cases for checking the functions defined in thefollowing target standard:JESD220, Universal Flash Storage (UFS) Standard version 1.1AMIPI M-PHY and MIPI UniPro test cases are not in the scope of this document. Product Details...
Click here to purchase The purpose of this standard is to define the minimum set of requirements for JEDEC standard compatible 4 Gb through 16 Gb x32 GDDR5X SGRAM devices. System designs based on the required aspects of this standard will be supported by all GDDR5X SGRAM vendors providing JEDEC standard compatible devices. Some aspects of the GDDR5X standard such as AC timings were not...
Click here to purchase This document defines the GDDR5X SGRAM memory standard, including features, device operation,electrical charactersitics, timings, signal pin assignments and package.The purpose of this standard is to define the minimum set of requirements for JEDEC standard compatible4 Gb through 16 Gb x32 GDDR5X SGRAM devices. System designs based on the required aspects of thisstandard...
Click here to purchase TThe HBM DRAM is tightly coupled to the host compute die with a distributed interface. The interface is divided into independent channels. Each channel is completely independent of one another. Channels are not necessarily synchronous to each other. The HBM DRAM uses a wide-interface architecture to achieve high-speed, low-power operation. The HBM DRAM uses differential...
Click here to purchase The HBM DRAM is tightly coupled to the host compute die with a distributed interface. The interface isdivided into independent channels. Each channel is completely independent of one another. Channels arenot necessarily synchronous to each other. The HBM DRAM uses a wide-interface architecture to achievehigh-speed, low power operation. Each channel interface maintains a 128...
