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This part of IEC TS 62607, which is a Technical Specification, specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.
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Product Details
- Published:
- 04/22/2020
- ISBN(s):
- 9780580991981
- Number of Pages:
- 24
- File Size:
- 1 file , 1.6 MB
- Product Code(s):
- 30363345, 30363345, 30363345